TPL7407LAQPWRQ1 TI
Available
TPL7407LAQPWRQ1 TI
1 Features 1• Qualified for Automotive Applications • AEC-Q100 Qualified With the Following Results: – Device Temperature Grade 1: –40°C to +125°C Ambient Operating Temperature Range – Device HBM ESD Classification Level 2 – Device CDM ESD Classification Level C4B • 600-mA Rated Drain Current (Per Channel) • CMOS Pin-to-Pin Improvement of 7-channel Darlington Array (For Example: ULN2003A) • Power Efficient (Very low VOL) – Less Than 4 Times Lower VOL at 100 mA Than Darlington Array • Very Low Output Leakage < 10 nA Per Channel • High-Voltage Outputs 30 V • Compatible with 1.8-V to 5-V Microcontroller and Logic Interface • Internal Free-wheeling Diodes for Inductive Kickback Protection • Input Pull-down Resistors Allows Tri-stating the Input Driver • Input RC-Snubber to Eliminate Spurious Operation in Noisy Environment • ESD Protection Exceeds JESD 22 – 2-kV HBM, 500-V CDM
1 Features 1• Qualified for Automotive Applications • AEC-Q100 Qualified With the Following Results: – Device Temperature Grade 1: –40°C to +125°C Ambient Operating Temperature Range – Device HBM ESD Classification Level 2 – Device CDM ESD Classification Level C4B • 600-mA Rated Drain Current (Per Channel) • CMOS Pin-to-Pin Improvement of 7-channel Darlington Array (For Example: ULN2003A) • Power Efficient (Very low VOL) – Less Than 4 Times Lower VOL at 100 mA Than Darlington Array • Very Low Output Leakage < 10 nA Per Channel • High-Voltage Outputs 30 V • Compatible with 1.8-V to 5-V Microcontroller and Logic Interface • Internal Free-wheeling Diodes for Inductive Kickback Protection • Input Pull-down Resistors Allows Tri-stating the Input Driver • Input RC-Snubber to Eliminate Spurious Operation in Noisy Environment • ESD Protection Exceeds JESD 22 – 2-kV HBM, 500-V CDM
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